Omega/Theta

for ultra-fast crystal orientation and rocking curve measurements

The universal Omega/Theta X-ray diffractometer is a fully automated vertical three axes diffractometer to determine the orientation of various crystals using Omega-scan method and to determine rockingcurve measurement using Theta-scan method.

Ultra-fast Omega-scan approach

  • 200 times faster than Theta-scan method

  • Automatic evaluation of the complete lattice orientation in 3D

  • Determination of crystal orientation within 5 seconds

User friendly and cost effective

    • Convenient sample handling and easy to operate

    • Advanced user friendly software

    • Low energy consumption and operating costs

For research and production quality control

    • Omega/Theta-scan in a single device

    • Azimuthal setting and marking of crystal orientation

    • Highest precision, i.e. up to (1/1000)°

    • Rocking curve measurement using Theta-scan method

Modular design and flexibility

    • Future proof with various upgrade options

    • Customized solutions for special application based on customers' request

    • Optical recognition of flat and notch


Highlights

    • Fully automated complete lattice orientation measurment of single crystals

    • Ultra-fast crystal orientation measurement using Omega-scan method

    • Automated rocking-curve measurement after orientation determination or automatic reflection search

    • Angular resolution of the diffractometer: 0.1 arc sec.

    • Sample size up to 450 mm

    • Appropriate for research and production quality control

Omega-scan diagram (SiC)
Turbine blade, map of one orientation component
(Si, Ge) wafer, orientation map
lattice parameter map

Omega-scan method

All desired crystal orientation parameters are captured in one rotation within 5 seconds.

Rocking-curve measurement

Arrangement with channel-cut crystal collimator.

Technical specifications

X-ray sourceStandard X-ray tube, Cu anode
DetectorScintillation counter (single or double)
Sample holderPrecise turntable (accuracy 0.01°), mounting plate and tools for sample adjustment
Crystal collimatorPrimary Ge or Si channel-cut collimator, measurable minimal broadening: < 10 arc sec
Mappingx-y table, lateral resolution 0.1 mm
DimensionsH 1950 mm × D 820 mm × W 1200 mm
Weight650 kg
Power supply208-240 V, 16 A single phase, 50-60 Hz
Water coolingFlow – 4l/min, max. pressure 8 bar, T ≤ 30° C

Options

    • Laser scanner for sample shape measurement

    • Photographic camera and image processing for flat and notch determination

    • Further sample rotation axis for 3D mapping

    • Secondary channel-cut collimator (analyzer)

    • Equipment for sample adjustment

    • X and Y axis movement for orientation mapping

Special applications

    • Orientation mapping of turbine blades (single-crystalline Ni based superalloys)

    • Determination of lattice parameters [(Si, Ge) solid solutions]

    • High-resolution diffraction (reciprocal-lattice mapping)